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AUTHORS (1-2 of 2)
Ieee Computer Society Technical Council On Test Technology
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  IEEE design & test

New York, NY : Institute of Electrical and Electronics Engineers -Access this resource online 		 
EJOURNALS
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  Journal of electronic testing

[Dordrecht] : Kluwer Academic Publishers, ©1990- -Access this resource online More... 		1990-
EJOURNALS
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