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BJL CLASSMARK
KDL CLASSMARK
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BJL, Hull
KDL, Scarborough
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AUTHORS (1-5 of 5)
Ieee Computer Society
1
Mark
The changing philosophy of test : proceedings of the international test conference 1990, September 1
International Test Conference (1990: Washington, DC)
Los Alamitos : IEEE Computer Society Press, 1990.
1990
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7882 T3 I6(1990)
8 WEEK LOAN
AVAILABLE
2
Mark
Discover the new world of test and design : proceedings of the International Test Conference held at
International Test Conference (1992: Baltimore, Maryland)
Los Alamitos, Calif. : IEEE Computer Society Press, 1992.
1992
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7882 T3 I6(1992)
8 WEEK LOAN
AVAILABLE
3
Mark
How societies embrace information technology : lessons for management and the rest of us.
Cortada, James W.
Hoboken, N.J. : Wiley, c2009.
c2009
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 5th Floor
HM 851 C8
8 WEEK LOAN
AVAILABLE
4
Mark
Information security : a strategic approach
LeVeque, Vincent.
Hoboken, N.J. : Wiley-Interscience, c2006.
c2006
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL Reading Room 1st floor HDC
TK 5105.59 L6
4 WEEK LOAN
DUE 30-05-24
5
Mark
Integration of Test with design and manufacturing : proceedings of the International Test Conference
International Test Conference (1987: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1987.
1987
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE