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Corporate Author International Test Conference (1990: Washington, DC)
Title The changing philosophy of test : proceedings of the international test conference 1990, September 10-14, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
Publication Info Los Alamitos : IEEE Computer Society Press, 1990.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6(1990)  8 WEEK LOAN  AVAILABLE

Descript 1083p.
ISBN 081869064X
Click on the terms below to find similar items in the catalogue
Corporate Author International Test Conference (1990: Washington, DC)
Alt author IEEE Computer Society.
Descript 1083p.
ISBN 081869064X
Corporate Author International Test Conference (1990: Washington, DC)
Alt author IEEE Computer Society.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6(1990)  8 WEEK LOAN  AVAILABLE

Descript 1083p.
Alt author IEEE Computer Society.
ISBN 081869064X

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