LEADER 00000nam 2200217 a 4500
001 0936898
003 UkHlHU
007 t
008 000509 1 1990 000 eng
020 081869064X
040 UkHlHU
050 4 |fq|aTK 7882 T3 I6(1990)
110 2 International Test Conference (1990: Washington, DC)
245 04 The changing philosophy of test :|bproceedings of the
international test conference 1990, September 10-14,
Washington, DC /|csponsored by the IEEE Computer Society
Test Technology Technical Committee and IEEE Philadelphia
Section.
260 Los Alamitos :|bIEEE Computer Society Press,|c1990.
300 1083p.
710 2 IEEE Computer Society.
946 6XX absent
