LEADER 00000nam 2200229 a 4500
001 0877985
007 t
008 001810 9 1987 000 eng
020 081860798X
040 BLAISE
050 4 TK 7882 T3 I6
110 2 International Test Conference (1987: Washington, D.C.)
245 00 Integration of Test with design and manufacturing :
|bproceedings of the International Test Conference,
September 1-3, 1987, Sheraton Washington Hotel, Washington,
D.C. /|csponsored by The IEEE Computer Society [and] IEEE
PhiladelphiaSection.
260 Washington, D.C. :|bComputer Society Press of the IEEE,
|c1987.
300 1151p.
710 2 IEEE Computer Society.
710 2 IEEE Philadelphia Section.
946 6XX absent
