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BJL CLASSMARK
KDL CLASSMARK
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BJL, Hull
KDL, Scarborough
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AUTHORS (1-4 of 4)
Institute Of Electrical And Electronics Engineers Philadelphia Section
1
Mark
Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, Sh
International Test Conference (1989: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1989.
1989
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE
2
Mark
New frontiers in testing : proceedings of the International Test Conference, 1988, September 12, 13,
International Test Conference (1988: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1988.
1988
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE
Institute Of Electrical And Electronics Engineers United Kingdom And Republ
3
Mark
Developments in power-system protection : proceedings.
International Conference on Developments in Power-System Protection,2nd, London, 1980.
London : I.E.E., 1980.
1980
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL basement journals
q TK 5 I59 C7(185)
8 WEEK LOAN
ASK at the Reading Room
4
Mark
International conference on new developments in Automatic Testing.
New developments in automatic testing.
London : Institution of Electrical Engineers, 1977.
1977
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL basement journals
q TK 5 I59 C7(158)
8 WEEK LOAN
ASK at the Reading Room
