LEADER 00000nam 2200229 a 4500
001 0913725
007 t
008 002011 0 1989 000 eng
020 0818689625
040 BLAISE
050 4 |fq|aTK 7882 T3 I6
110 2 International Test Conference (1989: Washington, D.C.)
245 00 Meeting the tests of time :|bproceedings of the
International Test Conference, 1989, August 29-31,
Sheraton Washington Hotel, Washington, DC /|csponsored by
the Computer Society of the IEEE, Test Technology
Technical Committee and IEEE Philadelphia Section.
260 Washington, D.C. :|bComputer Society Press of the IEEE,
|c1989.
300 959p.
710 2 Institute of Electrical and Electronics Engineers.
Philadelphia Section.
710 2 Institute of Electrical and Electronics Engineers.
Computer Society. Test Technology Committee.
946 6XX absent
