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Author Sato, Yoshihiko.
Title Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman.
Publication Info New York : Industrial Press : Society of Manufacturing Engineers, 2005.


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 BJL Teaching Reserve  658.575 SAT  UNTIL CLOSING  ASK at the Reading Room
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Descript x, 206 p. : ill. ; 24cm.
ISBN 0831132035
9780831132033
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Author Sato, Yoshihiko.
Subject Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.
Alt author Kaufman, J. Jerry.
Descript x, 206 p. : ill. ; 24cm.
ISBN 0831132035
9780831132033
Author Sato, Yoshihiko.
Subject Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.
Alt author Kaufman, J. Jerry.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL Teaching Reserve  658.575 SAT  UNTIL CLOSING  ASK at the Reading Room

Subject Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.
Descript x, 206 p. : ill. ; 24cm.
Alt author Kaufman, J. Jerry.
ISBN 0831132035
9780831132033
Persistent link to this item
Click link and copy URL from browser navigation toolbar

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