TK7882.P3 .P38 2021 : Pattern Recognition. Part III : ICPR International Workshops and Challenges, virtual event, January 10-15, 2021, proceedings / Alberto Del Bimbo [and seven others], editors.; Online materials
2021
1
TK 7882 P3 R2 : Statistical and neural classifiers : an integrated approach to design.; BJL
2001
1
TK 7882 P3 T3 : Pattern recognition / Sergios Theodoridis and Konstantinos Koutroumbas.; BJL
c2006
1
TK 7882 S5 I6 : Intersil application handbook : excellence in signal processing and control integrated circuits.; Departmental Locations
1985
1
TK 7882 S5 L7 : Two-dimensional signal and image processing.; BJL
TK 7882 T3 I6(1990) / q : The changing philosophy of test : proceedings of the international test conference 1990, September 10-14, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.; BJL
1990
1
TK 7882 T3 I6(1991) / q : Test : faster, better, sooner : [proceedings of the International Test Conference held at the Opryland Hotel, Nashville, TN, USA, October 26-30, 1991].; BJL
1991
1
TK 7882 T3 I6(1992) / q : Discover the new world of test and design : proceedings of the International Test Conference held at the Convention Center, Baltimore, Maryland, September 20-24, 1992.; BJL
1992
1
TK 7882 T3 P2 : Integrating design and test : using CAE tools for ATE programming.; BJL
TK 7883.1 B8 : Glossary of terms used in automatic controlling and regulating systems : [BS 1523.; Departmental Locations
1954
1
TK 7883.1 B9 : Control engineering : theory worked examples and problems.; BJL
1976
1
TK 7883.1 C7 / q : Computer-aided learning and design in control education.; BJL
1985
1
TK 7883.1 D2 / q : Feedback and Control Systems.; BJL
1974
1
TK 7883.1 D4 : Feedback systems : input-output properties / by C.A. Desoer and M. Vidyasagar.; BJL
1975
1
TK 7883.1 D6 : Schaum's outline of theory and problems of feedback and control systems / Joseph J. Distefano, Allen R. Stubberud, Ivan J. Williams.; BJL