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Corporate Author International Test Conference (1992: Baltimore, Maryland)
Title Discover the new world of test and design : proceedings of the International Test Conference held at the Convention Center, Baltimore, Maryland, September 20-24, 1992.
Publication Info Los Alamitos, Calif. : IEEE Computer Society Press, 1992.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6(1992)  8 WEEK LOAN  AVAILABLE
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Descript 1012p.
ISBN 0780307607
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Corporate Author International Test Conference (1992: Baltimore, Maryland)
Subject Electronics.
Alt author IEEE Computer Society.
Descript 1012p.
ISBN 0780307607
Corporate Author International Test Conference (1992: Baltimore, Maryland)
Subject Electronics.
Alt author IEEE Computer Society.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6(1992)  8 WEEK LOAN  AVAILABLE

Subject Electronics.
Descript 1012p.
Alt author IEEE Computer Society.
ISBN 0780307607
Persistent link to this item
Click link and copy URL from browser navigation toolbar

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Persistent link to this item
Click link and copy URL from browser navigation toolbar