LEADER 00000nam 2200229 a 4500
001 0877993
007 t
008 001810 9 1986 000 eng
020 0818607262
040 BLAISE
050 4 TK 7882 T3 I6
110 2 International Test Conference (1986: Washington, D.C.)
245 00 Testing's impact on design and technology :|bproceedings
of the International Test Conference, September 8-11, 1986
[Sheraton Washington Hotel, Washington, D.C.] /|csponsored
by the IEEE Computer Society [and] IEEE Philaddelphia
Section.
260 Washington, D.C. :|bIEEE Computer Society Press,|c1986.
300 1009p.
710 2 IEEE Computer Society.
710 2 IEEE Philadelphia Section.
946 6XX absent
