LEADER 00000nam 2200229 a 4500 001 0877993 007 t 008 001810 9 1986 000 eng 020 0818607262 040 BLAISE 050 4 TK 7882 T3 I6 110 2 International Test Conference (1986: Washington, D.C.) 245 00 Testing's impact on design and technology :|bproceedings of the International Test Conference, September 8-11, 1986 [Sheraton Washington Hotel, Washington, D.C.] /|csponsored by the IEEE Computer Society [and] IEEE Philaddelphia Section. 260 Washington, D.C. :|bIEEE Computer Society Press,|c1986. 300 1009p. 710 2 IEEE Computer Society. 710 2 IEEE Philadelphia Section. 946 6XX absent
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