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AUTHORS (1-2 of 2)
Agrawal Vishwani D
1
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  Test generation for VLSI chips : tutorial
Agrawal, Vishwani D.
Washington, D.C. : I.E.E.E. Computer Society Press, 1988.   		1988
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7872 I61 A2  8 WEEK LOAN  AVAILABLE
2
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  Unified methods for VLSI simulation and test generation. by Kwang-Ting Cheng and V.D. Agrawal.
Cheng, Kwang-Ting.
Boston, Mass. : Kluwer Academic Publishers, 1989.   		1989
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7874 C5  8 WEEK LOAN  AVAILABLE
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