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BJL CLASSMARK
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KDL, Scarborough
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AUTHORS (1-3 of 3)
Benninghoven A 1932
1
Mark
Secondary ion mass spectrometry SIMS IX : proceedings of the Ninth International Conference on Secon
Chichester : John Wiley & Sons, 1994.
1994
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
QD 96 S43 S4
8 WEEK LOAN
AVAILABLE
2
Mark
Secondary Ion mass spectrometry : SIMS VI : proceedings of the Sixth International Conference ... Ve
International Conference on Secondary Ion Mass Spectrometry (6th: 1987: Versailles)
Chichester : Wiley, 1988.
1988
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
QD 96 S43 S4
8 WEEK LOAN
AVAILABLE
3
Mark
Secondary ion mass spectrometry : SIMS XII : proceedings of the Twelfth International Conference on
International Conference on Secondary Ion Mass Spectrometry (12th : 1999 : Université Catholique de Louvain)
Amsterdam : Elsevier, 2000.
2000
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
QD 96 S43 S4
8 WEEK LOAN
AVAILABLE