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Author Braatz, Paul Otto.
Title Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy (TDLS).
Publication Info Ann Arbor, Mich. : University Microfilms International, 1985.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  QC 611.6 D4 B8  8 WEEK LOAN  AVAILABLE

Descript 385p.
Note Thesis.
University of California, Los Angeles, 1984.
Thesis.
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Author Braatz, Paul Otto.
Series (Ph.D.) - Univ
Subject Electricity.
Electric current.
Semiconductors.
Descript 385p.
Note Thesis.
University of California, Los Angeles, 1984.
Thesis.
Author Braatz, Paul Otto.
Series (Ph.D.) - Univ
Subject Electricity.
Electric current.
Semiconductors.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  QC 611.6 D4 B8  8 WEEK LOAN  AVAILABLE

Subject Electricity.
Electric current.
Semiconductors.
Descript 385p.
Note Thesis.
University of California, Los Angeles, 1984.
Thesis.

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