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Record:
Author
Braatz, Paul Otto.
Title
Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy (TDLS).
Publication Info
Ann Arbor, Mich. : University Microfilms International, 1985.
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LOCATION
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LOAN TYPE
STATUS
BJL 3rd Floor
QC 611.6 D4 B8
8 WEEK LOAN
AVAILABLE
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Descript
385p.
Note
Thesis.
University of California, Los Angeles, 1984.
Thesis.
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Author
Braatz, Paul Otto.
Series
(Ph.D.) - Univ
Subject
Electricity.
Electric current.
Semiconductors.
Descript
385p.
Note
Thesis.
University of California, Los Angeles, 1984.
Thesis.
Author
Braatz, Paul Otto.
Series
(Ph.D.) - Univ
Subject
Electricity.
Electric current.
Semiconductors.
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
QC 611.6 D4 B8
8 WEEK LOAN
AVAILABLE
Subject
Electricity.
Electric current.
Semiconductors.
Descript
385p.
Note
Thesis.
University of California, Los Angeles, 1984.
Thesis.
Persistent link to this item
Click link and copy URL from browser navigation toolbar
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