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Record:
Author
Butler, Kenneth M.
Title
Assessing fault model and test quality. by Kenneth M. Butler and M. Ray Mercer.
Publication Info
Boston, Mass. : Kluwer Academic, 1992.
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LOCATION
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LOAN TYPE
STATUS
BJL 3rd Floor
TK 7874 B9
8 WEEK LOAN
AVAILABLE
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Descript
132p.
ISBN
0792392221
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Author
Butler, Kenneth M.
Series
The Kluwer international series in engineering and computer science ; 57
Subject
Digital integrated circuits -- Testing.
Alt author
Mercer, Melvin Ray.
Descript
132p.
ISBN
0792392221
Author
Butler, Kenneth M.
Series
The Kluwer international series in engineering and computer science ; 57
Subject
Digital integrated circuits -- Testing.
Alt author
Mercer, Melvin Ray.
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7874 B9
8 WEEK LOAN
AVAILABLE
Subject
Digital integrated circuits -- Testing.
Descript
132p.
Alt author
Mercer, Melvin Ray.
ISBN
0792392221
Persistent link to this item
Click link and copy URL from browser navigation toolbar
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