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Author Butler, Kenneth M.
Title Assessing fault model and test quality. by Kenneth M. Butler and M. Ray Mercer.
Publication Info Boston, Mass. : Kluwer Academic, 1992.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7874 B9  8 WEEK LOAN  AVAILABLE

Descript 132p.
ISBN 0792392221
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Author Butler, Kenneth M.
Series The Kluwer international series in engineering and computer science ; 57
Subject Digital integrated circuits -- Testing.
Alt author Mercer, Melvin Ray.
Descript 132p.
ISBN 0792392221
Author Butler, Kenneth M.
Series The Kluwer international series in engineering and computer science ; 57
Subject Digital integrated circuits -- Testing.
Alt author Mercer, Melvin Ray.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7874 B9  8 WEEK LOAN  AVAILABLE

Subject Digital integrated circuits -- Testing.
Descript 132p.
Alt author Mercer, Melvin Ray.
ISBN 0792392221

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