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BJL CLASSMARK
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Record:
Author
Fujiwara, Hideo.
Title
Logic testing and design for testability.
Publication Info
Cambridge, Mass. : MIT Press, 1985.
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LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7885 F9
8 WEEK LOAN
AVAILABLE
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Descript
284p.
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Author
Fujiwara, Hideo.
Series
MIT Press series in computer systems
Subject
Electronics.
Computer hardware.
Descript
284p.
Author
Fujiwara, Hideo.
Series
MIT Press series in computer systems
Subject
Electronics.
Computer hardware.
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7885 F9
8 WEEK LOAN
AVAILABLE
Subject
Electronics.
Computer hardware.
Descript
284p.
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