Start Over Return To Browse Limit/Sort
     
Limit search to available items
Save marked records Save all on page
AUTHORS (1-2 of 2)
Hoyland James Donaldson
1
Mark
  In-situ measurements of laser irradiated zinc sulphide films on silicon.
Hoyland, James Donaldson.
1996.   		1996
THESIS
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL Basement b  T/H 1996 M.Sc. H8  UNTIL CLOSING  ASK at the Reading Room
2
Mark
  Optical characterisation and simulation of excimer laser annealed amorphous silicon.
Hoyland, James Donaldson.
2001.   		2001
THESIS
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL Basement b  T/H 2001 Ph.D. H8  UNTIL CLOSING  ASK at the Reading Room
Save marked records Save all on page
Locate in results
Start Over Return To Browse Limit/Sort