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Corporate Author International Test Conference (1986: Washington, D.C.)
Title Testing's impact on design and technology : proceedings of the International Test Conference, September 8-11, 1986 [Sheraton Washington Hotel, Washington, D.C.] / sponsored by the IEEE Computer Society [and] IEEE Philaddelphia Section.
Publication Info Washington, D.C. : IEEE Computer Society Press, 1986.


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 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE
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Descript 1009p.
ISBN 0818607262
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Corporate Author International Test Conference (1986: Washington, D.C.)
Alt author IEEE Computer Society.
IEEE Philadelphia Section.
Descript 1009p.
ISBN 0818607262
Corporate Author International Test Conference (1986: Washington, D.C.)
Alt author IEEE Computer Society.
IEEE Philadelphia Section.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE

Descript 1009p.
Alt author IEEE Computer Society.
IEEE Philadelphia Section.
ISBN 0818607262
Persistent link to this item
Click link and copy URL from browser navigation toolbar

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