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Conference Asian Test Symposium (11th : 2002 : Guam)
Asian Test Symposium (11th : 2002 : Guam)
Title 11th Asian Test Symposium (ATS'02) : proceedings of the 11th Asian Test Symposium : 18-20 November, 2002, Guam, USA / sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan.
Parallel Title ATS'02
Publication Info Los Alamitos, California : IEEE Computer Society, c2002.



Descript xxi, 437 p. : ill. ; 28 cm.
Note "IEEE Computer Society Order Number PR01825"--T.p. verso.
Proceedings for 1992- cataloged as a serial in LC.
ISBN 0769518257
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Conference Asian Test Symposium (11th : 2002 : Guam)
Asian Test Symposium (11th : 2002 : Guam)
Subject Electronic digital computers -- Circuits -- Testing -- Congresses.
Electronic circuits -- Testing -- Congresses.
Fault-tolerant computing -- Congresses.
Alt author IEEE Computer Society. Test Technology Technical Committee.
Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.
Special Interest Group on System LSI Design Methodology (Japan)
Parallel Title ATS'02
Descript xxi, 437 p. : ill. ; 28 cm.
Note "IEEE Computer Society Order Number PR01825"--T.p. verso.
Proceedings for 1992- cataloged as a serial in LC.
ISBN 0769518257
Conference Asian Test Symposium (11th : 2002 : Guam)
Asian Test Symposium (11th : 2002 : Guam)
Subject Electronic digital computers -- Circuits -- Testing -- Congresses.
Electronic circuits -- Testing -- Congresses.
Fault-tolerant computing -- Congresses.
Alt author IEEE Computer Society. Test Technology Technical Committee.
Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.
Special Interest Group on System LSI Design Methodology (Japan)
Parallel Title ATS'02

Subject Electronic digital computers -- Circuits -- Testing -- Congresses.
Electronic circuits -- Testing -- Congresses.
Fault-tolerant computing -- Congresses.
Descript xxi, 437 p. : ill. ; 28 cm.
Note "IEEE Computer Society Order Number PR01825"--T.p. verso.
Proceedings for 1992- cataloged as a serial in LC.
Alt author IEEE Computer Society. Test Technology Technical Committee.
Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.
Special Interest Group on System LSI Design Methodology (Japan)
ISBN 0769518257

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