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Ieee Philadelphia Section
1
Mark
  Integration of Test with design and manufacturing : proceedings of the International Test Conference
International Test Conference (1987: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1987.   		1987
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE
2
Mark
  Testing's impact on design and technology : proceedings of the International Test Conference, Septem
International Test Conference (1986: Washington, D.C.)
Washington, D.C. : IEEE Computer Society Press, 1986.   		1986
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE
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