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BJL CLASSMARK
KDL CLASSMARK
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BJL, Hull
KDL, Scarborough
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AUTHORS (1-4 of 4)
Ieee Neural Networks Council
1
Mark
Fuzzy models for pattern recognition : methods that search for structures in data
New York : Institute of Electrical and Electronics Engineers, 1992.
1992
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q Q 327 F9
8 WEEK LOAN
AVAILABLE
Ieee Philadelphia Section
2
Mark
Integration of Test with design and manufacturing : proceedings of the International Test Conference
International Test Conference (1987: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1987.
1987
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE
3
Mark
Testing's impact on design and technology : proceedings of the International Test Conference, Septem
International Test Conference (1986: Washington, D.C.)
Washington, D.C. : IEEE Computer Society Press, 1986.
1986
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE
Ieee Professional Communication Society
4
Mark
Writing and speaking in the technology professions : a practical guide
IEEE Professional Communication Society.
New York : IEEE Press, 1992.
1992
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
T 11 W9
8 WEEK LOAN
AVAILABLE
