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BJL CLASSMARK
KDL CLASSMARK
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KDL, Scarborough
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AUTHORS (1-2 of 2)
Institute Of Electrical And Electronics Engineers Electronics Division
1
Mark
International conference on new developments in Automatic Testing.
New developments in automatic testing.
London : Institution of Electrical Engineers, 1977.
1977
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL basement journals
q TK 5 I59 C7(158)
8 WEEK LOAN
ASK at the Reading Room
Institute Of Electrical And Electronics Engineers Philadelphia Section
2
Mark
Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, Sh
International Test Conference (1989: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1989.
1989
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE
