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AUTHORS (1-2 of 2)
Institute Of Electrical And Electronics Engineers Philadelphia Section
1
Mark
  Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, Sh
International Test Conference (1989: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1989.  
1989
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE
2
Mark
  New frontiers in testing : proceedings of the International Test Conference, 1988, September 12, 13,
International Test Conference (1988: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1988.  
1988
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE
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