Library
Your session will expire automatically in
0
seconds.
Continue session
End session now
SearchType
TITLE
KEYWORD
AUTHOR
SUBJECT
BJL CLASSMARK
KDL CLASSMARK
PERIODICAL TITLE
ISN
RESOURCE NAME
RESOURCE SUBJECT
Search
Search Scope
BJL, Hull
KDL, Scarborough
All Libraries
Limit search to available items
AUTHORS (1-2 of 2)
Institute Of Electrical And Electronics Engineers Philadelphia Section
1
Mark
Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, Sh
International Test Conference (1989: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1989.
1989
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE
2
Mark
New frontiers in testing : proceedings of the International Test Conference, 1988, September 12, 13,
International Test Conference (1988: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1988.
1988
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7882 T3 I6
8 WEEK LOAN
AVAILABLE