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Corporate Author International Test Conference (1989: Washington, D.C.)
Title Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section.
Publication Info Washington, D.C. : Computer Society Press of the IEEE, 1989.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE

Descript 959p.
ISBN 0818689625
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Corporate Author International Test Conference (1989: Washington, D.C.)
Alt author Institute of Electrical and Electronics Engineers. Philadelphia Section.
Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Committee.
Descript 959p.
ISBN 0818689625
Corporate Author International Test Conference (1989: Washington, D.C.)
Alt author Institute of Electrical and Electronics Engineers. Philadelphia Section.
Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Committee.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE

Descript 959p.
Alt author Institute of Electrical and Electronics Engineers. Philadelphia Section.
Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Committee.
ISBN 0818689625

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