Library
Your session will expire automatically in
0
seconds.
Continue session
End session now
SearchType
TITLE
KEYWORD
AUTHOR
SUBJECT
BJL CLASSMARK
KDL CLASSMARK
PERIODICAL TITLE
ISN
RESOURCE NAME
RESOURCE SUBJECT
Search
Search Scope
BJL, Hull
KDL, Scarborough
All Libraries
Limit search to available items
AUTHORS (1-3 of 3)
Teo Boon Keng
1
Mark
EXAFS : basic principles and data analysis.
Teo, Boon Keng.
Berlin : Springer, 1986.
1986
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
QC 482 S6 T3
8 WEEK LOAN
DUE 19-05-24
2
Mark
EXAFS spectroscopy : techniques and applications.
Materials Research Society.
New York : Plenum, 1981.
1981
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
Chemistry Dept.
QC 482 S6 E9
DEPT DECISION
ASK AT DEPT
3
Mark
EXAFS spectroscopy : techniques and applications.
Materials Research Society.
New York : Plenum, 1981.
1981
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
QC 482 S6 E9
8 WEEK LOAN
AVAILABLE
