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Corporate Author United States, National Bureau of standards, institute for materials research.
Title Trace characterization : chemical and physical.
Publication Info Washington D. c. : U. S. Govt. Printing Office., 1967.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  QC 100 U5 M75(100)  8 WEEK LOAN  AVAILABLE

Descript 580p.
Note National bureau of standards, monograph 100.
Click on the terms below to find similar items in the catalogue
Corporate Author United States, National Bureau of standards, institute for materials research.
Subject Measurement.
Metrology -- Physics.
Metric system -- Physics.
Chemistry, Analytic.
Qualitative analysis -- Analytical chemistry.
Alt author Meinke, W. Wayne.
Sribner, Bourdon F.
Materials Research symposium, 1st Gaithesburg, (Md.), October 1966.
Descript 580p.
Note National bureau of standards, monograph 100.
Corporate Author United States, National Bureau of standards, institute for materials research.
Subject Measurement.
Metrology -- Physics.
Metric system -- Physics.
Chemistry, Analytic.
Qualitative analysis -- Analytical chemistry.
Alt author Meinke, W. Wayne.
Sribner, Bourdon F.
Materials Research symposium, 1st Gaithesburg, (Md.), October 1966.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  QC 100 U5 M75(100)  8 WEEK LOAN  AVAILABLE

Subject Measurement.
Metrology -- Physics.
Metric system -- Physics.
Chemistry, Analytic.
Qualitative analysis -- Analytical chemistry.
Descript 580p.
Note National bureau of standards, monograph 100.
Alt author Meinke, W. Wayne.
Sribner, Bourdon F.
Materials Research symposium, 1st Gaithesburg, (Md.), October 1966.

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