LEADER 00000nam 2200205 a 4500 001 0445529 003 UkHlHU 007 t 008 002610 1 1949 000 eng 040 UkHlHU 050 4 QC 411 T6 100 0 Tolansky, Samuel. 245 00 Multiple-beam interferometry of surfaces and films. 260 Oxford :|bClarendon Press,|c1949. 300 187p. 500 Monographs on the physics and chemistry of materials. 946 6XX absent
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