LEADER 00000nam  2200205 a 4500 
001    0910973 
007    t  
008    001610 0 1989                000   eng   
020    0306432242 
040    CURLBL 
050  4 TK 7872 I61 D3 
245 00 Defect and fault tolerance in VLSI systems :|b[proceedings
       of the International Workshop on Defect and Fault 
       Tolerance in VLSI Systems, held October 6-7, 1988, in 
       Springfield, Massachusetts and October 22-24, 1989, in 
       Tampa, Florida] /|cedited by Israel Koren ... [et al.]. 
260    New York :|bPlenum,|c1989-1990. 
300    2v. 
700 0  Koren, Israel,|d1945- 
946    6XX absent 
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