LEADER 00000nam 2200205 a 4500 001 0910973 007 t 008 001610 0 1989 000 eng 020 0306432242 040 CURLBL 050 4 TK 7872 I61 D3 245 00 Defect and fault tolerance in VLSI systems :|b[proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 6-7, 1988, in Springfield, Massachusetts and October 22-24, 1989, in Tampa, Florida] /|cedited by Israel Koren ... [et al.]. 260 New York :|bPlenum,|c1989-1990. 300 2v. 700 0 Koren, Israel,|d1945- 946 6XX absent
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