Library
Your session will expire automatically in
0
seconds.
Continue session
End session now
SearchType
TITLE
KEYWORD
AUTHOR
SUBJECT
BJL CLASSMARK
KDL CLASSMARK
PERIODICAL TITLE
ISN
RESOURCE NAME
RESOURCE SUBJECT
Search
Search Scope
BJL, Hull
KDL, Scarborough
All Libraries
Limit search to available items
Record:
Author
Agrawal, Vishwani D.
Title
Test generation for VLSI chips : tutorial / V.D. Agrawal and S.C. Seth.
Publication Info
Washington, D.C. : I.E.E.E. Computer Society Press, 1988.
Location/Availability
More Details
Full Record
Web View
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7872 I61 A2
8 WEEK LOAN
AVAILABLE
Persistent link to this item
Click link and copy URL from browser navigation toolbar
Descript
401p.
ISBN
081868786X
Click on the terms below to find similar items in the catalogue
Author
Agrawal, Vishwani D.
Alt author
Seth, Sharad C.
Descript
401p.
ISBN
081868786X
Author
Agrawal, Vishwani D.
Alt author
Seth, Sharad C.
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7872 I61 A2
8 WEEK LOAN
AVAILABLE
Descript
401p.
Alt author
Seth, Sharad C.
ISBN
081868786X
Persistent link to this item
Click link and copy URL from browser navigation toolbar
Links and services for this item:
Persistent link to this item
Click link and copy URL from browser navigation toolbar
