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Author Bardell, Paul H.
Title Built in test for VLSI : pseudorandom techniques / P.H. Badell, W.H. McAnney, J. Savir.
Publication Info New York : Wiley, 1987.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7874 B2  8 WEEK LOAN  AVAILABLE

Descript 354p.
ISBN 0471624632
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Author Bardell, Paul H.
Alt author McAnney, William H.
Savir, Jacob.
Descript 354p.
ISBN 0471624632
Author Bardell, Paul H.
Alt author McAnney, William H.
Savir, Jacob.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7874 B2  8 WEEK LOAN  AVAILABLE

Descript 354p.
Alt author McAnney, William H.
Savir, Jacob.
ISBN 0471624632

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