LEADER 00000nam 2200229 a 4500
001 0828232
003 UkHlHU
007 t
008 000703 8 1987 000 eng
020 0471624632
040 UkHlHU
050 4 TK 7874 B2
100 1 Bardell, Paul H.
245 10 Built in test for VLSI :|bpseudorandom techniques /|cP.H.
Badell, W.H. McAnney, J. Savir.
260 New York :|bWiley,|c1987.
300 354p.
700 1 McAnney, William H.
700 1 Savir, Jacob.
946 6XX absent
|