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BJL CLASSMARK
KDL CLASSMARK
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BJL, Hull
KDL, Scarborough
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BJL CLASSMARKS (1-3 of 3)
TK 7874 B9
1
Mark
Assessing fault model and test quality. by Kenneth M. Butler and M. Ray Mercer.
Butler, Kenneth M.
Boston, Mass. : Kluwer Academic, 1992.
1992
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7874 B9
8 WEEK LOAN
AVAILABLE
2
Mark
Introduction to mixed-signal IC test and measurement
Burns, Mark.
New York : Oxford University Press, 2001.
2001
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7874 B9
8 WEEK LOAN
AVAILABLE
3
Mark
Microelectronic systems : design, modelling, and testing.
Buchanan, William.
London : Wiley, 1997.
1997
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TK 7874 B9
8 WEEK LOAN
AVAILABLE
