Library Services / All Locations

TK 7882 I6 C2 / q : Readings in information visualization : using vision to think / written and editied by S.K. Card, J.D. Mackinlay, B. Shneiderman.; BJL

1998

1

TK 7882 I6 C5

2

TK 7882 I6 D6 : Display devices.; BJL

1980

1

TK 7882 I6 E3 : Electronic display devices / edited by Shoichi Matsumoto.; BJL

1990

1

TK 7882 I6 M4 : Introduction to information visualization / Riccardo Mazza.; BJL

c2009

1

TK 7882 I6 S7

2

TK 7882 I6 V8 : The visualization handbook / edited by Charles D. Hansen, Chris R. Johnson.; BJL

c2005

1

TK 7882 I6 W9 : Introduction to scientific visualization / Helen Wright.; BJL

c2007

1

TK 7882 M38 D61 / q : DISA information.; BJL

1965-

1

TK 7882 M38 D611 / q : Dantec information : measurement and analysis.; BJL

1993

1

TK 7882 M38 E3 : Electronic measurements for scientist / by H.V. Malmstadt and others.; Departmental Locations

1974

1

TK 7882 M7 C7 : Modulation.; BJL

1973

1

TK 7882 M7 O6 / q : Telecommunication systems. Modulation.; BJL

1976

1

TK 7882 O6 A6 : Applications of pattern recognition.; BJL

1982

1

TK 7882 O6 P6 : Picture engineering.; BJL

1982

1

TK 7882 P3 A8 : Biometrics : advanced identify verification : the complete guide.; BJL

2000

1

TK 7882 P3 D2 : Data complexity in pattern recognition / Mitra Basu and Tin Kam Ho (eds).; BJL

c2006

1

TK 7882 P3 L8 : Pattern recognition using neural networks : theory and algorithms for engineers and scientists.; BJL

1997

1

TK 7882 P3 P2 : Adaptive pattern recognition and neural networks.; BJL

1989

1

TK7882.P3 .P38 2021 : Pattern Recognition. Part III : ICPR International Workshops and Challenges, virtual event, January 10-15, 2021, proceedings / Alberto Del Bimbo [and seven others], editors.; Online materials

2021

1

TK 7882 P3 R2 : Statistical and neural classifiers : an integrated approach to design.; BJL

2001

1

TK 7882 P3 T3 : Pattern recognition / Sergios Theodoridis and Konstantinos Koutroumbas.; BJL

c2006

1

TK 7882 S5 I6 : Intersil application handbook : excellence in signal processing and control integrated circuits.; Departmental Locations

1985

1

TK 7882 S5 L7 : Two-dimensional signal and image processing.; BJL

1990

1

TK 7882 S5 O9 : Signal processing of speech.; BJL

1990

1

TK 7882 S55 B6 / q : The theory of signal detectability : ROC curves and their character.; BJL

1973

1

TK 7882 S55 C5 : Speech processing and synthesis toolboxes.; BJL

2000

1

TK 7882 S55 R1 : Digital processing of speech signals / Lawrence R. Rabiner, Ronald W. Schafer.; BJL

1978

1

TK7882.S65 : Developments in speech synthesis / Mark Tatham, Katherine Morton.; BJL

c2005

1

TK 7882 S65 C6 : Introducing speech and language process.; BJL

2005

1

TK 7882 S65 H7

2

TK7882.S65 I566 2007 : Advances in nonlinear speech processing : International Conference on Nonlinear Speech Processing, NOLISP 2007, Paris, France, May 22-25, 2007 : revised selected papers / Mohamed Chetouani ... [et al.] (eds.).; BJL

c2007

1

TK7882.S65 N66 2010 : Advances in nonlinear speech processing : International Conference on Nonlinear Speech Processing, NOLISP 2009, Vic, Spain, June 25-27, 2009, revised selected papers / Jordi Solé-Casals, Vladimir Zaiats (eds.).; BJL

c2010

1

TK 7882 S65 T3 : Text to speech synthesis : new paradigms and advances / [edited by] Shrikanth Narayanan, Abeer Alwan.; BJL

2005

1

TK7882.S65 T37 2009 : Sound capture and processing : practical approaches / Ivan J. Tashev.; BJL

2009

1

TK 7882 T3 B8 : Automatic test equipment.; BJL

1991

1

TK 7882 T3 E8

2

TK 7882 T3 I5

2

TK 7882 T3 I6

4

TK 7882 T3 I6(1990) / q : The changing philosophy of test : proceedings of the international test conference 1990, September 10-14, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.; BJL

1990

1

TK 7882 T3 I6(1991) / q : Test : faster, better, sooner : [proceedings of the International Test Conference held at the Opryland Hotel, Nashville, TN, USA, October 26-30, 1991].; BJL

1991

1

TK 7882 T3 I6(1992) / q : Discover the new world of test and design : proceedings of the International Test Conference held at the Convention Center, Baltimore, Maryland, September 20-24, 1992.; BJL

1992

1

TK 7882 T3 P2 : Integrating design and test : using CAE tools for ATE programming.; BJL

1987

1

TK 7883 A1 A24

2

TK 7883 A1 P96 : Progress in control engineering / edited by R.H. Macmillan, T.J. Higgins and P. Naslin.; BJL

1966

1

TK 7883 O3 : State space analysis of control systems.; BJL

1967

1

TK 7883.1 06 / q : Modelling of dynamic response ...; BJL

1977

1

TK 7883.1 A5 : Introduction to control systems.; BJL

1984

1

TK 7883.1 B2 : Control systems engineering : modelling and simulation, control theory and microprocessor implementation.; BJL

1986

1

TK 7883.1 B6

2