TK 7882 I6 B4 : The craft of information visualization : readings and reflections / written and edited by Benjamin B. Bederson, Ben Shneiderman.; BJL
The craft of information visualization : readings and reflections / written and edited by Benjamin B.
BJL
BOOK
c2003
TK 7882 I6 C2 / q : Readings in information visualization : using vision to think / written and editied by S.K. Card, J.D. Mackinlay, B. Shneiderman.; BJL
Readings in information visualization : using vision to think / written and editied by S.K. Card, J.D
BJL
Adaptive pattern recognition and neural networks.
BJL
BOOK
1989
TK7882.P3 .P38 2021 : Pattern Recognition. Part III : ICPR International Workshops and Challenges, virtual event, January 10-15, 2021, proceedings / Alberto Del Bimbo [and seven others], editors.; Online materials
Pattern Recognition. Part III : ICPR International Workshops and Challenges, virtual event, January 1
Online materials
EBOOKS
2021
TK 7882 P3 R2 : Statistical and neural classifiers : an integrated approach to design.; BJL
Statistical and neural classifiers : an integrated approach to design.
BJL
BOOK
2001
TK 7882 P3 T3 : Pattern recognition / Sergios Theodoridis and Konstantinos Koutroumbas.; BJL
Pattern recognition / Sergios Theodoridis and Konstantinos Koutroumbas.
BJL
BOOK
c2006
TK 7882 S5 I6 : Intersil application handbook : excellence in signal processing and control integrated circuits.; Departmental Locations
Intersil application handbook : excellence in signal processing and control integrated circuits.
Departmental Locations
BOOK
1985
TK 7882 S5 L7 : Two-dimensional signal and image processing.; BJL
Integration of Test with design and manufacturing : proceedings of the International Test Conference,
BJL
BOOK
1987
Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, She
BJL
BOOK
1989
New frontiers in testing : proceedings of the International Test Conference, 1988, September 12, 13,
BJL
BOOK
1988
Testing's impact on design and technology : proceedings of the International Test Conference, Septemb
BJL
BOOK
1986
TK 7882 T3 I6(1990) / q : The changing philosophy of test : proceedings of the international test conference 1990, September 10-14, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.; BJL
The changing philosophy of test : proceedings of the international test conference 1990, September 10
BJL
BOOK
1990
TK 7882 T3 I6(1991) / q : Test : faster, better, sooner : [proceedings of the International Test Conference held at the Opryland Hotel, Nashville, TN, USA, October 26-30, 1991].; BJL
Test : faster, better, sooner : [proceedings of the International Test Conference held at the Oprylan
BJL
BOOK
1991
TK 7882 T3 I6(1992) / q : Discover the new world of test and design : proceedings of the International Test Conference held at the Convention Center, Baltimore, Maryland, September 20-24, 1992.; BJL
Discover the new world of test and design : proceedings of the International Test Conference held at
BJL
BOOK
1992
TK 7882 T3 P2 : Integrating design and test : using CAE tools for ATE programming.; BJL
Integrating design and test : using CAE tools for ATE programming.
BJL