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Corporate Author International Test Conference (1987: Washington, D.C.)
Title Integration of Test with design and manufacturing : proceedings of the International Test Conference, September 1-3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by The IEEE Computer Society [and] IEEE PhiladelphiaSection.
Publication Info Washington, D.C. : Computer Society Press of the IEEE, 1987.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE

Descript 1151p.
ISBN 081860798X
Click on the terms below to find similar items in the catalogue
Corporate Author International Test Conference (1987: Washington, D.C.)
Alt author IEEE Computer Society.
IEEE Philadelphia Section.
Descript 1151p.
ISBN 081860798X
Corporate Author International Test Conference (1987: Washington, D.C.)
Alt author IEEE Computer Society.
IEEE Philadelphia Section.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TK 7882 T3 I6  8 WEEK LOAN  AVAILABLE

Descript 1151p.
Alt author IEEE Computer Society.
IEEE Philadelphia Section.
ISBN 081860798X

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