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Record:
Corporate Author
International Test Conference (1992: Baltimore, Maryland)
Title
Discover the new world of test and design : proceedings of the International Test Conference held at the Convention Center, Baltimore, Maryland, September 20-24, 1992.
Publication Info
Los Alamitos, Calif. : IEEE Computer Society Press, 1992.
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LOCATION
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STATUS
BJL 3rd Floor
q TK 7882 T3 I6(1992)
8 WEEK LOAN
AVAILABLE
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Descript
1012p.
ISBN
0780307607
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Corporate Author
International Test Conference (1992: Baltimore, Maryland)
Subject
Electronics.
Alt author
IEEE Computer Society.
Descript
1012p.
ISBN
0780307607
Corporate Author
International Test Conference (1992: Baltimore, Maryland)
Subject
Electronics.
Alt author
IEEE Computer Society.
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
q TK 7882 T3 I6(1992)
8 WEEK LOAN
AVAILABLE
Subject
Electronics.
Descript
1012p.
Alt author
IEEE Computer Society.
ISBN
0780307607
Persistent link to this item
Click link and copy URL from browser navigation toolbar
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