Library

BJL CLASSMARKS (1-4 of 4)

TK 7882 T3 I6

1

Mark

Integration of Test with design and manufacturing : proceedings of the International Test Conference
International Test Conference (1987: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1987.

1987
BOOK

LOCATION	SHELVED AT	LOAN TYPE	STATUS
BJL 3rd Floor	TK 7882 T3 I6	8 WEEK LOAN	AVAILABLE

2

Mark

Meeting the tests of time : proceedings of the International Test Conference, 1989, August 29-31, Sh
International Test Conference (1989: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1989.

1989
BOOK

LOCATION	SHELVED AT	LOAN TYPE	STATUS
BJL 3rd Floor	q TK 7882 T3 I6	8 WEEK LOAN	AVAILABLE

3

Mark

New frontiers in testing : proceedings of the International Test Conference, 1988, September 12, 13,
International Test Conference (1988: Washington, D.C.)
Washington, D.C. : Computer Society Press of the IEEE, 1988.

1988
BOOK

LOCATION	SHELVED AT	LOAN TYPE	STATUS
BJL 3rd Floor	TK 7882 T3 I6	8 WEEK LOAN	AVAILABLE

4

Mark

Testing's impact on design and technology : proceedings of the International Test Conference, Septem
International Test Conference (1986: Washington, D.C.)
Washington, D.C. : IEEE Computer Society Press, 1986.

1986
BOOK

LOCATION	SHELVED AT	LOAN TYPE	STATUS
BJL 3rd Floor	TK 7882 T3 I6	8 WEEK LOAN	AVAILABLE