Library
Your session will expire automatically in
0
seconds.
Continue session
End session now
SearchType
TITLE
KEYWORD
AUTHOR
SUBJECT
BJL CLASSMARK
KDL CLASSMARK
PERIODICAL TITLE
ISN
RESOURCE NAME
RESOURCE SUBJECT
Search
Search Scope
BJL, Hull
KDL, Scarborough
All Libraries
Limit search to available items
Record:
Author
Schroder, Dieter K.
Title
Semiconductor material and device characterization.
Publication Info
Hoboken : Wiley, 2006.
Edition
3rd ed.
Location/Availability
More Details
Full Record
Web View
Click on the following to:
Go to eBook
Persistent link to this item
Click link and copy URL from browser navigation toolbar
Descript
1 online resource (799 p.)
Edition
3rd ed.
Note
Description based upon print version of record.
200 annual accesses. UkHlHU
ISBN
9780471749080
Click on the terms below to find similar items in the catalogue
Author
Schroder, Dieter K.
Subject
Semiconductors -- Testing.
Semiconductors.
Descript
1 online resource (799 p.)
Edition
3rd ed.
Note
Description based upon print version of record.
200 annual accesses. UkHlHU
ISBN
9780471749080
Author
Schroder, Dieter K.
Subject
Semiconductors -- Testing.
Semiconductors.
Subject
Semiconductors -- Testing.
Semiconductors.
Descript
1 online resource (799 p.)
Note
Description based upon print version of record.
200 annual accesses. UkHlHU
ISBN
9780471749080
Persistent link to this item
Click link and copy URL from browser navigation toolbar
Links and services for this item:
Persistent link to this item
Click link and copy URL from browser navigation toolbar