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SUBJECTS (1-2 of 2)
Surfaces Technology Analysis
1
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  An introduction to surface analysis by XPS and AES
Watts, John F.
Chichester : J. Wiley, 2003.  
2003
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TP 156 S95 W3  8 WEEK LOAN  AVAILABLE
2
Mark
  Surface infrared and Raman spectroscopy : methods and applications
Suëtaka, W.
New York : Plenum Press, 1995.  
1995
BOOK
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  TA 418.7 S9  8 WEEK LOAN  AVAILABLE
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