Library
Your session will expire automatically in
0
seconds.
Continue session
End session now
SearchType
TITLE
KEYWORD
AUTHOR
SUBJECT
BJL CLASSMARK
KDL CLASSMARK
PERIODICAL TITLE
ISN
RESOURCE NAME
RESOURCE SUBJECT
Search
Search Scope
BJL, Hull
KDL, Scarborough
All Libraries
Limit search to available items
SUBJECTS (1-2 of 2)
Surfaces Technology Analysis
1
Mark
An introduction to surface analysis by XPS and AES
Watts, John F.
Chichester : J. Wiley, 2003.
2003
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TP 156 S95 W3
8 WEEK LOAN
AVAILABLE
2
Mark
Surface infrared and Raman spectroscopy : methods and applications
Suëtaka, W.
New York : Plenum Press, 1995.
1995
BOOK
LOCATION
SHELVED AT
LOAN TYPE
STATUS
BJL 3rd Floor
TA 418.7 S9
8 WEEK LOAN
AVAILABLE