Start Over Please hold this item Export MARC Display Return To Browse
 
     
Limit search to available items
Record: Previous Record Next Record
Corporate Author Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference (1992: Strasbourg).
Title Semiconductor materials analysis and fabrication process control : proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 / edited by G.M. Crean, R. Stuck, and J.A. Woollam.
Publication Info Amsterdam : North-Holland, 1993.


LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7872 S4 S4  8 WEEK LOAN  AVAILABLE
Persistent link to this item
Click link and copy URL from browser navigation toolbar

Descript 338p.
ISBN 0444899081
 Click on the terms below to find similar items in the catalogue
Corporate Author Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference (1992: Strasbourg).
Series European materials research society symposia proceedings; 34
Alt author Crean, G.M.
Stuck, R.
Woollam, J.A.
Descript 338p.
ISBN 0444899081
Corporate Author Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference (1992: Strasbourg).
Series European materials research society symposia proceedings; 34
Alt author Crean, G.M.
Stuck, R.
Woollam, J.A.
LOCATION SHELVED AT LOAN TYPE STATUS
 BJL 3rd Floor  q TK 7872 S4 S4  8 WEEK LOAN  AVAILABLE

Descript 338p.
Alt author Crean, G.M.
Stuck, R.
Woollam, J.A.
ISBN 0444899081
Persistent link to this item
Click link and copy URL from browser navigation toolbar

Links and services for this item:

Persistent link to this item
Click link and copy URL from browser navigation toolbar